Gaia
Teknika Esperimentalak I: Egituraren Karakterizazioa
Gaiari buruzko datu orokorrak
- Modalitatea
- Ikasgelakoa
- Hizkuntza
- Ingelesa
Irakasgaiaren azalpena eta testuingurua
This subject provides the students with the necessary knowledge to understand the basic experimental methods for structural characterization, including microscopies and diffraction techniques.Irakasleak
| Izena | Erakundea | Kategoria | Doktorea | Irakaskuntza-profila | Arloa | Helbide elektronikoa |
|---|---|---|---|---|---|---|
| ALEGRIA LOINAZ, ANGEL MARIA | Euskal Herriko Unibertsitatea | Unibertsitateko Katedraduna | Doktorea | Elebakarra | Fisika Aplikatua | angel.alegria@ehu.eus |
| FERNANDEZ ALONSO, FELIX | Otras universidades extranjeras | Doktorea | ||||
| MAESTRO MARTIN, ARMANDO | MPC- Materials Physics Center | Besteak | Doktorea | armando.maestro@ehu.eus |
Gaitasunak
| Izena | Pisua |
|---|---|
| Que los estudiantes conozcan los fundamentos de las distintas técnicas de microsopias para la caracterización estructural | 50.0 % |
| Que los estudiantes conozcan los fundamentos de las técnicas de difracción para la caracterización estructural | 50.0 % |
Irakaskuntza motak
| Mota | Ikasgelako orduak | Ikasgelaz kanpoko orduak | Orduak guztira |
|---|---|---|---|
| Magistrala | 18 | 33 | 51 |
| Laborategiko p. | 12 | 12 | 24 |
Irakaskuntza motak
| Izena | Orduak | Ikasgelako orduen ehunekoa |
|---|---|---|
| Eskola magistralak | 18.0 | 0 % |
| Materialak eta gailuak konpontzeko eta ezaugarritzeko jarduera praktikoak (praktika gidatuak) | 12.0 | 0 % |
Ebaluazio-sistemak
| Izena | Gutxieneko ponderazioa | Gehieneko ponderazioa |
|---|---|---|
| Test motako azterketa | 100.0 % | 100.0 % |
Ohiko deialdia: orientazioak eta uko egitea
Final evaluation: 100% theoretical-practical exam.In case the student does not show up at the final exam, he/she will be considered as not presented.
Ezohiko deialdia: orientazioak eta uko egitea
Final evaluation: 100% theoretical-practical exam.In case the student does not show up at the final exam, he/she will be considered as not presented.
Irakasgai-zerrenda
PART 1 – MICROSCOPIES1.1 INTRODUCTION: MEASURING AT THE NANOSCALE
1.2 THE LIMITS OF OPTICAL MICROSCOPY. CONFOCAL MICROSCOPY
1.3 ELECTRON MICROSCOPIES. TRANSMISSION ELECTRON MICROSCOPY, SCANNING ELECTRON MICROSCOPY
1.4 SCANNING PROBE MICROSCOPY: PRINCIPLES OF OPERATION. TUNNELLING MICROSCOPY,
1.5 ATOMIC FORCE MICROSCOPY. BASIC PRINCIPLES AND MULTIMODE OPERATION.
PART 2 – SCATTERING TECHNIQUES
2.1 BASIC NOTIONS: SCATTERING, INTERFERENCE & DIFFRACTION
2.2 EXPERIMENTAL TECHNIQUES – NEUTRONS AND X-RAYS
2.3 WIDE-ANGLE DIFFRACTION
2.4 SMALL-ANGLE SCATTERING
Bibliografia
Oinarrizko bibliografia
1- ROBERT H WEBB, CONFOCAL OPTICAL MICROSCOPY, REP. PROG. PHYS. 59 (1996) 427¿471
2.- E. MEYER, H. J. HUG AND R. BENNEWITZ, SCANNING PROBE MICROSCOPY: THE LAB ON A TIP, SPRINGER VERLAG.
3.- THE NANOTECHNOLOGY MULTIMEDIA ENCYCLOPEDIC COURSES, EXPLORING NANOTECHNOLOGY, NANOPOLIS.
4.- SCANNING PROBE MICROSCOPY. THE LAB ON A TIP. E. MEYER, H.J. HUG, R. BENNEWITZ. SPRINGER
5.- J. P. EBERHART, STRUCTURAL AND CHEMICAL ANALISYS OF MATERIALS: X-RAY, ELECTRON AND NEUTRON DIFFRACTION - X-RAY, ELECTRON AND ION SPECTROMETRY, ELECTRON MICROSCOPY, WILEY, 1991
6.- R.-J. ROE, METHODS OF X-RAY AND NEUTRON SCATTERING IN POLYMER SCIENCE, OXFORD UNIVERSITY PRESS, 2000.
7.- C. HAMMOND, THE BASICS OF CRYSTALLOGRAPHY AND DIFFRACTION 2nd EDITION, OXFORD SCIENCE PUBLICATIONS, 2002.
Gehiago sakontzeko bibliografia
J. ALS-NIELSEN AND D. MCMORROW, ELEMENTS OF MODERN X-RAY PHYSICS, 2nd EDITION, WILEY, 2011.
F. FERNANDEZ-ALONSO AND D.L. PRICE, NEUTRON SCATTERING – FUNDAMENTALS, ACADEMIC PRESS, 2013.
F. FERNANDEZ-ALONSO AND D.L. PRICE, NEUTRON SCATTERING – MAGNETIC AND QUANTUM PHENOMENA, ACADEMIC PRESS, 2015.
F. FERNANDEZ-ALONSO AND D.L. PRICE, NEUTRON SCATTERING – APPLICATIONS IN BIOLOGY, CHEMISTRY, AND MATERIALS SCIENCE, ACADEMIC PRESS, 2017.