Positron Annihilation Spectroscopy for the Determination of the Thickness and Defect Profile in Thin Semiconductors Layers
- Egileak:
- A. Zubiaga, J.A. García, F. Plazaola, F. Tuomisto, J. Zúñiga-Pérez and V. Muñoz-Sanjosé
- Urtea:
- 2007
- Aldizkaria:
- Phys. Rev. B
- Liburukia:
- 75