Technological offer
- Emissivity measurements from 50 ºC to 1000 ºC (sample-dependent range) in the mid-infrared under vacuum, air or a reducing atmosphere.
- Room-temperature reflectivity measurements: mid-infrared integrating sphere, UV-VIS-NIR bi-directional reflectance and transmittance (in-plane).
- Electron microscopy (SEM, TEM) and X-ray diffraction (single crystals at room temperature, powders as a function of temperature).