MICROSCOPY AND CHARACTERIZATION OF SURFACES

• Eclipse E600 Optical Microscope (OM) (Nikon). SAT: Izasa Scientific. Operation: Transmission, reflection, polarized light. Vertical arrangement. Objectives: 5x, 10x, 20x and 100x. Eyepieces: 10x. Digital camera to capture images. Mettler Toledo FP82HT heating plate.
• Eclipse E80i Optical Microscope (OM) (Nikon). SAT: Izasa Scientific. Operation: Transmission, reflection, polarized light, epifluorescence. Vertical arrangement. Objectives: 5x, 10x, 20x and 100x. Eyepieces: 10x. Digital camera to capture images.
• Atomic Force Microscope (AFM) MULTIMODE 8, Nanoscope V (Bruker). SAT: Azbil Telstar Technologies. Scanners: EVLR, JV, JVH, JVHC (Max Range XY: 100 micron x 100 micron, Z: 5.0 micron). Operation: Contact, Intermittent Contact (TappingModeTM), Phase Imaging, Magnetic Force Microscopy (MFM), Electrostatic Force Microscopy (EFM). Accessories: MFM Kit, Heater Controller.
• Atomic Force Microscope (AFM) Dimension ICON Nanoscope V (Bruker). SAT: Azbil Telstar Technologies. Scanner: Dimension Hybrid XYZ SPM Head (Max XY Range: 90 micron x 90 micron, Z: 7.0 micron). Controller: Nanoscope V. Operation: Contact, Intermittent Contact (TappingModeTM), Phase Imaging, Magnetic Force Microscopy (MFM), Electrostatic Force Microscopy (EFM), ScanAsyst®, PeakForce TappingTM, PeakForce QNMTM. Accessories: MFM Kit, Fluid Holder, PeakForce TUNATM.

PHYSICAL-CHEMICAL BEHAVIOR

• Differential Scanning Calorimeter DSC822e (Mettler Toledo). SAT: Mettler Toledo. Operation: - 50C / 550C (Air, N2, O2). Accessories: Auto sampler (34 samples).
• Differential Scanning Calorimeter DSC3 + (Mettler Toledo). SAT: Mettler Toledo. Operation: - 90C / 550C (Air, N2, O2). Accessories: Auto sampler (34 samples).
• Dynamic-Mechanical-Thermal Analyzer (DMTA) Eplexor 100 N (Gabo Qualimeter). SAT: Netzsch. Operation: Traction, flexion, compression (- 100C / 350C).
• Alpha Dielectric Relaxation Spectrometer (DRS) (Novocontrol Technologies). SAT: Novocontrol Technologies. Operation: 0.1 Hz - 10 MHz. Accessories: Cryogenic system.
• 4200 SCS Semiconductor Analyzer (Keithley). SAT: Instrumentos de Medida S.L. Operation: I-V, C-V. Accessories: Tip table (Max. 4).
• PVT 100 (Haake). SAT: Instrumentos Físicos Ibérica S.L. Operation: Dilatometry, thermal conductivity (melt).
• UV-3600 spectrometer (Shimadzu). SAT: Izasa Scientific. Operation: Transmittance, reflectance. Detectors: PMT, InGaAs, Pbs (185 nm-3300 nm). Accessories: PMT, InGaAs, Pbs, Integrating sphere (specular, diffuse reflectance).
• ZetaSizer Ultra (Malvern Panalytical). SAT: IESMAT (Instrumentación Specific de Materiales, S.A.). Operation: Particle size, concentration, Z potential. Accessories: Autotitrador MPT-3DEP.

MECHANICAL CONDUCT

• 4206 Universal Mechanical Testing Machine (Instron) (5900 retrofit). SAT: Instron. Operation: Traction, flexion, compression. Maximum load capacity 100 kN.
• 5967 Universal Mechanical Testing Machine (Instron). SAT: Instron. Operation: Traction, flexion, compression. Maximum load capacity 100 kN. Accessories: Environmental Chamber
• Miniature Mechanical Tests MINIMAT (Rheometric Scientific). SAT: Rheometric Scientific. Operation: Traction. Maximum load capacity 200 N.

PREPARATION OF SAMPLE

• Various equipment for sample preparation: Ultramicrotome Ultracut R (Leica), Spincoating P6700 (Specialty Coating Systems), and others for conditioning, mixing, cutting and polishing.