XSL Content
Instrumentation I
- Centre
- Faculty of Science and Technology
- Degree
- Double Degree in Physics and Electronic Engineering
- Academic course
- 2023/24
- Academic year
- 3
- No. of credits
- 6
- Languages
- Spanish
- Basque
TeachingToggle Navigation
Study type | Hours of face-to-face teaching | Hours of non classroom-based work by the student |
---|---|---|
Lecture-based | 30 | 45 |
Seminar | 5 | 7.5 |
Applied classroom-based groups | 5 | 7.5 |
Applied laboratory-based groups | 10 | 15 |
Applied computer-based groups | 10 | 15 |
Teaching guideToggle Navigation
AimsToggle Navigation
The skills expected to be developed in this subject are:
- Describe the basic principles of measurement systems, including calibration and error.
- Know the principles of operation of sensors of different nature for the measurement of various physical magnitudes as well as the main practical problems associated to them.
- Identify the effect of noise and electromagnetic interference on the operation of systems for electronic instrumentation, know the associated limitations and be able to apply strategies to minimize them.
- Analyze and design basic electronic circuits and systems for signal synthesis, data acquisition and signal conditioning.
- Skillfully use computer tools for the analysis and design of circuits and electronic instrumentation systems, as well as for the virtual instrumentation and control of measuring instruments.
- Communicate, both orally and in writing, knowledge, results and ideas related to basic electronic instrumentation.
These skills are a concretion of the competencies defined at module and/or subject level in the study plans of the Degree in Electronic Engineering and the Degree in Physics.
TemaryToggle Navigation
1. Introduction
1.1 Introduction to electronic instrumentation
Definitions and basic concepts. Fundamental functions and blocks of an electronic measurement system. Variables and signals
1.2 Characteristics of a measurement system
Static characteristics: Calibration curve. Dynamic characteristics. Errors and Calibration
1.3 Fundamental concepts
Amplification. Power transfer. Operational amplifier. Diodes
2.Sensors
2.1 Introduction
Transducers and sensors. Basic transduction processes. Smart sensors and MEMS
2.2 Classification of sensors
Classification criteria. Sensors for typical magnitudes.
2.3 Examples of basic sensors
Resistive sensors: Potentiometers, RTDs, strain gauges, thermistors. Capacitive and inductive sensors. Thermocouples. Optoelectronic sensors: Photodiodes and phototransistors.
2.4 Sensors for measuring electrical magnitudes.
Diode power detector
3.Signal conditioning
3.1 Introduction
3.2 Amplification
Differential amplifier. Transimpedance amplifier. Logarithmic amplifier. Instrumentation amplifier. Transducer bridge amplifier
3.3 Filtering
Passive RC filters. Active filters
3.4 Practical limitations in the use of the operational amplifier
Static limitations (impedances, saturation, input offset, bias currents, common mode rejection...). Dynamic limitations (bandwidth, slew rate)
4. Noise and electromagnetic interference
4.1 Introduction
4.2 Noise
Mathematical aspects. Thermal noise. 1/f Noise. Noise in the OPAMP. Effect of noise on circuits and systems.
Noise figure. Phase noise.
4.3 Electromagnetic interference
Context and definitions. Conductive coupling. Capacitive and inductive coupling. Radiative coupling
4.4 Measurements in the presence of noise
Lock-in amplifier. Spectrum analyzer
5.Generation and signal synthesis
5.1 Multivibrator circuits
Astable and monostable multivibrators. Integrated 555 timer. Astable with 555 IC. Monostable with 555 IC.
5.2 Harmonic oscillators
Oscillation conditions. Oscillators with RC network and Operational Amplifier. LC tuned oscillators. Voltage Controlled Oscillators (VCOs). Characteristic parameters of an oscillator. Crystal oscillators.
5.3 Phase Locked Loops (PLL)
6. Data acquisition and instrument control
6.1 Data acquisition systems
6.2 Software for instrumentation
MethodologyToggle Navigation
The subject is developed in lectures, classroom practices and seminars. In addition, the subject also has laboratory practices and computer practices.
In the lectures, the theoretical concepts related to the subject will be explained, illustrating them with simple examples and problems to be solved by the students will be proposed. In the classroom practices, practical examples will be developed and the proposed problems will be corrected and discussed, promoting the active participation of the students. Finally, in order to promote collaborative learning, theoretical/practical seminars will also be held to deepen some of the topics covered.
In the computer practices and especially in the laboratory ones, the practical part of the subject will be worked on. These practices complement the theoretical concepts and are focused on practical cases of interest, to which the students must respond through the design, assembly and verification of the appropriate measurement systems.
In addition, the eGela tool will be used as a means of communication with the student and as a platform for disseminating learning material and teaching resources. Tasks will also be proposed through eGela and this tool will be used to provide the necessary feedback to improve learning.
Finally, the importance of tutorials is to be highlighted. Teachers' tutorial schedules are accessible from GAUR.
Assessment systemsToggle Navigation
CONTINUOUS ASSESSMENT SYSTEM:
Throughout the school period, students will carry out various tests and activities to assess their progress, with the following weighting:
- Class test (15% of the final mark)
- Deliverable assignments and exercises (10% of the final mark)
- Practices and reports (10% of the final mark)*
On the official date established in the examination period, the following will be carried out:
- Final written exam (65% of the final mark)**
* Practices are mandatory in the continuous assessment system.
** To pass the subject it is necessary to obtain at least a mark of 4 out of 10 in the written exam. If these 4 points are not reached, the grade for the subject will be that of the written exam.
Throughout the course, guidelines will be given to guide the student in improving their work.
RESIGNATION TO CONTINUOUS ASSESSMENT:
The student can resign to continuous assessment within the period indicated in the assessment regulations: 9 weeks from the beginning of the semester in accordance with the academic calendar of the center. The resignation will be made in writing, through a resignation document that must be delivered to the professor duly completed and signed.
In this case, the student will be evaluated through the FINAL EVALUATION SYSTEM, which will be graded as follows:
- Written exam (90% of the final grade) on the official date established in the exam period. This test will not necessarily be the same as the test that students evaluated through the continuous assessment system will take during the official exam period.
- Specific practice test (10% of the final mark). If at least a 4.5 out of 10 has been obtained in the written exam, a specific practice test must be satisfactorily completed and passed.
RESIGNATION TO ORDINARY CALL:
Not attending the individual test set on the official exam date will mean automatic resignation from the ordinary call, regardless of the evaluation system.
Compulsory materialsToggle Navigation
WEB page of the subject in eGela
BibliographyToggle Navigation
Basic bibliography
- S. Franco, Design with operational amplifiers and analog integrated circuits,
McGraw-Hill, 2005.
- A.S. Sedra, K.C. Smith, Microelectronic Circuits, Oxford University Press, New York, 2010.
In-depth bibliography
- D. Christiansen, Electronics Engineers¿ Handbook, McGraw-Hill, 1989.
- G. Meijer, Smart Sensor Systems, John Wiley & Sons, 2008.
- C. R. Paul, Introduction to Electromagnetic Compatibility, John Wiley & Sons, 1992.
- W.F. Egan, Phase-Lock Basics, John Wiley & Sons, 1998.
- G. Nash, Phase Locked Loops Design Fundamentals, AN 535, Motorola Semiconductor Application Note, 1994.
Examining board of the 5th, 6th and exceptional callToggle Navigation
- COLLANTES METOLA, JUAN MARIA
- SAGASTABEITIA BURUAGA, IBON
- VARONA FERNANDEZ, MARIA AMPARO
GroupsToggle Navigation
01 Teórico (Spanish - Mañana)Show/hide subpages
Weeks | Monday | Tuesday | Wednesday | Thursday | Friday |
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16-19 | 09:30-10:30 | ||||
16-28 | 09:30-10:30 | 09:30-10:30 |
Teaching staff
01 Seminar-1 (Spanish - Mañana)Show/hide subpages
Weeks | Monday | Tuesday | Wednesday | Thursday | Friday |
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20-29 | 09:30-10:30 |
01 Applied classroom-based groups-1 (Spanish - Mañana)Show/hide subpages
Weeks | Monday | Tuesday | Wednesday | Thursday | Friday |
---|---|---|---|---|---|
20-29 | 09:30-10:30 |
01 Applied laboratory-based groups-1 (Spanish - Mañana)Show/hide subpages
Weeks | Monday | Tuesday | Wednesday | Thursday | Friday |
---|---|---|---|---|---|
22-22 | 15:00-18:00 | ||||
27-27 | 15:00-19:00 | ||||
29-29 | 16:00-19:00 |
01 Applied laboratory-based groups-2 (Spanish - Mañana)Show/hide subpages
Weeks | Monday | Tuesday | Wednesday | Thursday | Friday |
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22-22 | 15:00-18:00 | ||||
27-27 | 15:00-19:00 | ||||
29-29 | 15:00-18:00 |
01 Applied computer-based groups-1 (Spanish - Mañana)Show/hide subpages
Weeks | Monday | Tuesday | Wednesday | Thursday | Friday |
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20-20 | 15:00-19:00 | ||||
26-26 | 15:00-19:00 | ||||
29-29 | 09:30-10:30 15:00-16:00 |
01 Applied computer-based groups-2 (Spanish - Mañana)Show/hide subpages
Weeks | Monday | Tuesday | Wednesday | Thursday | Friday |
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20-25 | 15:00-19:00 | ||||
29-29 | 08:30-09:30 | ||||
30-30 | 15:00-16:00 |
31 Teórico (Basque - Mañana)Show/hide subpages
Weeks | Monday | Tuesday | Wednesday | Thursday | Friday |
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16-19 | 09:30-10:30 | ||||
16-27 | 09:30-10:30 | ||||
16-29 | 09:30-10:30 |
31 Seminar-1 (Basque - Mañana)Show/hide subpages
Weeks | Monday | Tuesday | Wednesday | Thursday | Friday |
---|---|---|---|---|---|
20-29 | 09:30-10:30 |
31 Applied classroom-based groups-1 (Basque - Mañana)Show/hide subpages
Weeks | Monday | Tuesday | Wednesday | Thursday | Friday |
---|---|---|---|---|---|
20-27 | 09:30-10:30 | ||||
29-29 | 09:30-10:30 |
Teaching staff
31 Applied laboratory-based groups-1 (Basque - Mañana)Show/hide subpages
Weeks | Monday | Tuesday | Wednesday | Thursday | Friday |
---|---|---|---|---|---|
21-21 | 15:00-18:00 | ||||
26-26 | 15:00-19:00 | ||||
29-29 | 16:00-19:00 |
31 Applied laboratory-based groups-2 (Basque - Mañana)Show/hide subpages
Weeks | Monday | Tuesday | Wednesday | Thursday | Friday |
---|---|---|---|---|---|
21-21 | 15:00-18:00 | ||||
27-27 | 15:00-19:00 | ||||
29-29 | 16:00-19:00 |
31 Applied laboratory-based groups-3 (Basque - Mañana)Show/hide subpages
Weeks | Monday | Tuesday | Wednesday | Thursday | Friday |
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21-21 | 15:00-18:00 | ||||
26-26 | 15:00-19:00 | ||||
28-28 | 15:00-18:00 |
31 Applied computer-based groups-1 (Basque - Mañana)Show/hide subpages
Weeks | Monday | Tuesday | Wednesday | Thursday | Friday |
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19-19 | 15:00-19:00 | ||||
25-25 | 15:00-19:00 | ||||
28-28 | 09:30-10:30 | ||||
29-29 | 15:00-16:00 |
Teaching staff
31 Applied computer-based groups-2 (Basque - Mañana)Show/hide subpages
Weeks | Monday | Tuesday | Wednesday | Thursday | Friday |
---|---|---|---|---|---|
19-19 | 15:00-19:00 | ||||
25-25 | 15:00-19:00 | ||||
28-28 | 08:30-09:30 | ||||
29-29 | 15:00-16:00 |