Info_mol_y_mat_dif_ref_saxs_capilar

GENERAL X-RAY SERVICE OF THE UPV/EHU: MOLECULES AND MATERIAL UNIT

Equipment

Equipment: Diffraction for low angular positions

Brand: Rigaku

Model: SmartLab

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Description: Diffraction equipment for measurements at low angles

Multifunction diffractometer with optimized settings for XRR and SAXS. It has a Cu source (λ = 1.5418 Å), exchange of CBO optical paths for measurements with divergent or parallel beam and primary monochromator. It has sample holders in reflection/transmission configurations for solid or capillary samples. 1-D DteX250 detector.

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Applications:

X-ray diffraction at low angular positions allows evaluating the total scattering of the samples in reflection mode or in transmission mode. The optimization of the configurations automatically ensures optimal measurement conditions in both divergent and parallel beams. SAXS measurements provide information on the size, morphology and dispersion of materials and XRR measurements on thickness, density and roughness of layers at the nanometer scale.

The use of a specific sample stage allows XRD measurements in capillary to be addressed.

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Location:

Technological Platform “Martina Casiano”

Floor 0 Local: 0B1

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Person(s) responsible: