ELECTRONIC MICROSCOPY AND MATERIAL MICROANALYSIS
Equipment
Equipment: Schottky X-FEG type ultra-high resolution field emission electron microscope.
Brand: FEI.
Model: Titan Cubed G2.
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Description: Titan microscopes (FEI Company) are new generation equipment that incorporates a spherical aberration corrector (CEOS Company). Specifically, the Titan Imagen incorporates the corrector in the objective lens, which forms the image, making it the most appropriate microscope for obtaining ultra-high resolution images (HRTEM).
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Applications:
- TEM Magnetic Imaging – Lorentz Microscopy and Electron Holography
- HRTEM image
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Technical specifications:
- Alignments at 80, 200 and 300KV.
- Gatan US1000XP-P 2Kx2K camera.
- HAADF (Fischione) and FEI bright field and dark field detectors.
- Super-X EDX detector (ChemiSTEM technology with data acquisition and processing by Bruker's ESPRIT software).
- Gatan Quantum ER/965 P energy filter with Gatan 2Kx2K post filter camera.
- Lorentz lens.
- Simple acquisition sample holders.
- Double tilt analytical sample holder.
- Simple tilt sample holder for tomography.
- Acquisition software, both in TEM and STEM modes, for tomography, INSPECT 3D software for alignment and reconstruction. And FEI's Resolve RT for visualization. The reconstruction and visualization processing is done offline on another computer.
- Electron precession acquisition system.
- True Image software for the acquisition and reconstruction of focus series.
- Point-to-point resolution ≤ 0.07nm at 300KV and ≤ 0.11nm at 80KV.
- Resolution in STEM mode ≤ 0.136nm at 300KV.
- Energy resolution ≤ 0.3eV. inclination in a of ± 35º and in b of ± 30º.
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Responsible(s):
Sergio Fernandez
Location:
- Rosalind Franklin Building
- Sarriena neighborhood s/n.
- 48940.
- Leioa. Bizkaia.
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Contact:
Service technician
- Dr. Sergio Fernandez
- Telephone: 94 601 5998
- Email: sergio.fernandez@ehu.es