University of the Basque Country University of the Basque Country

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Info_Biomedicina_mic_mat_F7000

ELECTRONIC MICROSCOPY AND MATERIAL MICROANALYSIS

Equipment

Equipment: Schottky type field emission scanning electron microscope.

Brand: JEOL

Model: JSM-7000F

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Description: JEOL JSM 7600F scanning microscope, field emission gun and EDS elemental analysis system and in-lens electron detector. ____________________________________________________________________________

Applications:

  • Secondary electron detector (topographic information),
  • Backscattered electron detector (qualitative compositional and crystalline disorientation information),
  • Oxford EDX INCA
  • Nordlys II HKL premium EBSD detector (crystallographic information). Included in the Channel 5 software are both the HKL, PDF2, geological and NIST databases, as well as the acquisition and treatment software: Twist, Mambo, Tango, Salsa, Flamenco, Map Stitcher
  • Standards are available for quantitative microanalysis of numerous materials and minerals.
  • GSR software for shot particle analysis.

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Technical specifications:

  • Resolution in secondary electrons of 1.2nm at 30KV and 3nm at 1 KV.
  • 3nm resolution in backscattered electrons at 15KV and 10mm working distance.
  • The acceleration voltage is variable between 0.5KV and 30KV and the beam current is variable between 1 picoA and 200nA.

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Responsible(s):

  • Sergio Fernandez

Location:

  • Faculty of Science and Technology
  • Sarriena neighborhood s/n. 48940. Leioa. Bizkaia.

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Contact:

Service technician