ELECTRONIC MICROSCOPY AND MATERIAL MICROANALYSIS

Equipment: Scanning electron microscope with W filament

Brand: JEOL

Model: JSM-6400

____________________________________________________________________________

Description: This microscope is especially indicated for observing the surface of materials (geological, chemical-physical...), with the possibility of performing semiquantitative analyzes to obtain an approximation of the composition of the materials. It is possible to obtain, by using backscattered electrons, the distribution of elements and phases in the study of materials.

____________________________________________________________________________

Applications:

• Obtaining high resolution images with secondary electrons.
• Obtaining images with backscattered electrons and composition using a BSED detector (Back Scattering Electron Detector).
• Elemental chemical analysis using EDS spectroscopy.

____________________________________________________________________________

• Technical specifications:
• Thermionic cathode electron gun with tungsten filament.
• Secondary electron detector:
  • Image resolution
    • At 25 KV:
    • 3.5 nm (at 8 mm working distance).
    • 10.0 nm (at 39 mm working distance).
• Backscattered electron detector:
  • Image resolution
    • 10.0 nm (at 8 mm working distance).
• EDS analysis: qualitative elemental analysis with a resolution of 133 eV.
• Preparation of samples for scanning microscopy:
  • Materials: metallization with gold or evaporation with graphite.

_____________________________________________________________________

Responsible(s):

• Sergio Fernandez

Location:

• Faculty of Science and Technology
• Sarriena neighborhood s/n. 48940. Leioa. Bizkaia.

_____________________________________________________________________

Contact:

Service technician

• Dr. Sergio Fernandez
• Telephone: 94 601 5998
• Email: sergio.fernandez@ehu.es