ELECTRONIC MICROSCOPY AND MATERIAL MICROANALYSIS
Introduction
The Electronic Microscopy and Microanalysis of Materials Service has the appropriate infrastructure for the microstructural characterization of materials in both a massive sample (scanning electron microscopy and microanalysis) and a thin sample (transmission electron microscopy and microanalysis).
Equipment
Fields of application
Scanning electron microscopy
The images obtained in scanning electron microscopy provide both topographic information on the surface of a rough sample (fracture facies, coatings, micro-wires, etc.) and qualitative information on compositional differences, or crystalline orientation, of a sample. polished
Transmission electron microscopy
Transmission electron microscopy provides information, both in image and diffraction, from the same point on the sample and this information can be acquired for different inclinations of the sample with respect to the electron beam. This property gives it great versatility, since with it both crystalline defects (dislocations, grain joints) and compositional defects (antiphase boundaries, precipitates, segregations, etc.) can be characterized, as well as the crystalline structure. The fact of being able to do convergent beam diffraction (CBED) allows determining the crystalline cell, the point group and the space group of micro and nanometric crystals embedded, or not, in a larger sample. On the other hand, the EDX spectra (obtained by the emission of R-X photons) and the EELS spectra (obtained as a consequence of the loss of energy of the electrons when passing through the sample), which can be acquired at different points of the sample, They allow determining the chemical formulas of the phases under study, which can be nanometric in size.
IBF
The FIB available is a device that contains two columns, one of electrons and the other of ions forming a certain angle. It allows samples of a wide variety of materials (metals, ceramics, semiconductors) to be prepared for observation in a transmission electron microscope, these lamellae having practically parallel faces and thicknesses that can be controlled. The size of a sample is typically about 20mm long by 5mm wide and the thickness depends on the type of information required and its density.
Access rules
To access the Proteomics Unit, the requirements established in the SGIker access protocol and use of the available services must be met.
- Self-service access:
- Self-service access will be managed by the unit's technical staff.
- Equipment reservations in self-service mode may not exceed 5 hours, except for exceptions that are duly justified and assessed by the Service technician.
- In the case of not making responsible use of the reserve, e.g. Do not cancel it in advance if you cannot attend, do not use the equipment for more than 75% of the reserved time, etc. the Service may bill the total time.
- Each equipment reservation must be linked to a request number.
Application
The request for a service is made through the IKERKUDE application, which will help you maintain the traceability of all the work you carry out in the SGIker. When requesting a service, the user knows and accepts the access protocol and the rate that will be applied for the services provided.
Self-service
The request for equipment reservation will also be made through IKERKUDE, indicating that no samples are presented and specifying the equipment that you want to reserve so that the technical staff can schedule it in the reservation calendars.
Consultation of equipment occupancy
Location
The Electron Microscopy Service is located in the Faculty of Science and Technology, located at the University of the Basque Country/Euskal Herriko Unibertsitatea.
- UPV/EHU (Leioa Campus)
- Faculty of Science and Technology
- Barrio Sarriena s/n, C.P.:48940
- Leioa.
Contact
Service Technician
- Dr. Sergio Fernandez
- sergio.fernandez@ehu.eus
- Telephone: 94 601 5998