Positron Annihilation Spectroscopy for the Determination of the Thickness and Defect Profile in Thin Semiconductors Layers
- Authors:
- A. Zubiaga, J.A. García, F. Plazaola, F. Tuomisto, J. Zúñiga-Pérez and V. Muñoz-Sanjosé
- Year:
- 2007
- Journal:
- Phys. Rev. B
- Volume:
- 75