New Method for the Determination of the Defect Profile in Thin Layers Grown Over a Substrate
- Authors:
- A. Zubiaga, J. A. García , F. Plazaola , F. Tuomisto, J. Zúñiga and V. Muñoz-Sanjosé
- Year:
- 2007
- Journal:
- Phys. Status Solidi C 4
- Volume:
- 10
- Initial page - Ending page:
- 3973 - 3976