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;Special Session on Reflectance Analysis
* [http://www.kesinternational.org/ KES 2009]
* [http://www.kesinternational.org/ KES 2009]
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=KES 2009 Special Session on Intelligent Systems for Reflectance Analysis=


=== Chairs ===
=== Chairs ===
Línea 15: Línea 15:
[mailto:kes2009reflectanceanalysis@gmail.com]
[mailto:kes2009reflectanceanalysis@gmail.com]


===Description===
===Rationale for the special session===
 
El anlálisis de Reflectancia es un proceso fundamental en todos sistema de visión por computador. El conocimineto de las propiedades ópticas de los materiales y el comportamiento de la luz sobre estos, es lo que nos permite asociar la información contenida en la imagen con la realidad observada. Varios modelos de reflectancia han sido propuestos ( Dichromatic reflection model,  BRDF y sus derivados) su aplicación es fundamental tanto para visión como para visualización. Son muchos los paradigmas concernientes; Color constancy, espacios de color, estudio de la luz, propiedades de los materiales, optics, photometry, radiometry,...
: El gran objetivo de esta Special Session es tener un punto de encuentro para investigadores en este area, algo inusual en otros congresos.
 
------
 
Reflectance Analysis is a key process for computer vision systems. The knowledge of optical and phisycs properties of materials under light efects, let us to find the relacionship between image information and observed reality. Some models had been proposed for reflectance (Dichromatic Reflection Model, BRDF and their derivatives) their application are key for vision process and for visualization process too. A lot of paradigms are related to reflectance analysis; color constancy, color spaces, light research, phisycs properties of materials, optics, photometry, radiometry, ...
: The goal of this Special Session is to serve a meeting point for researches in this area.
 
===Important dates===
 
:Submission of papers: 1 March 2009


:Notification of acceptance: 1 April 2009
Reflectance Analysis is a key process in computer vision systems and applications. It allows the robust segmentation of the images. It has been studied and  applied in autononomous robotics, multimodal human computer interaction and remote sensing. There are some physical models of the interaction between light and the surfaces that have been used either for image rendering (visualization) or for image analysis. The most general is the BRDF model used in visualization programs. The Dichromatic Reflection Model has been proposed for the reflectance analysis of general images. This model is local and generalizations involving spatial information and non-linear effects will greatly increase its usefulness in real life applications. Knowledge Based  Inteligent tools may provide this generalization. Other related paradigms that can benefit from the application of Intelligent Systems tools are Color Constancy and Retinex. The special session is intended to gather researchers applying Reflectance Analysis to real life problems  and applications, or proposing innovative computational methods.
 
:Final paper to be received by: 1 May 2009


===Topics of interest===
===Topics of interest===
Línea 37: Línea 23:
* Shape from shading
* Shape from shading
* Shape from Reflection Analysis
* Shape from Reflection Analysis
* Sepaparating Specular Component
* Isolating Specular Component
* Reflectance Maps
* Reflectance Maps
* Reflectance Models
* Reflectance Models
Línea 47: Línea 33:
* Color Constancy
* Color Constancy
* Shadows
* Shadows
* Computational Intellligence for Reflectance Analysis
* BTF (bidirectional texture function) and BSSRDF (bidirectional surface scattering reflectance distribution function) and widen your application areas
===Important dates===


===Program committee===
* Submission of papers: 29 March 2009
* Notification of acceptance: 25 April 2009
* Final paper publication files to be received by: 23 May 2009
 
===Program committee (tentative)===


<table border=0 cellspacing=10 cellpadding=10 >
<table border=0 cellspacing=10 cellpadding=10 >
Línea 55: Línea 49:
;Richard M. Friedhoff  
;Richard M. Friedhoff  
;Casey A. Smith  
;Casey A. Smith  
;H. Ragheb  
;H. Ragheb --
;R. Hancock  
;R. Hancock  
;Stephen Grossberg  
;Stephen Grossberg  
;Z.G. Pan  
;Z.G. Pan  
;Jiuai Sun  
;Jiuai Sun --
;J.H. Xin  
;J.H. Xin  
;P. Kakumanu  
;P. Kakumanu  
;N. Bourbakis  
;N. Bourbakis  
;Hui-Liang Shen
;Hui-Liang Shen
;Thomas M. Lehmann  
;Thomas M. Lehmann --
;Todd Zickler  
;Todd Zickler  
;Yihong Wu  
;Yihong Wu --
;Kuk-Jin Yoon
;Kuk-Jin Yoon --
;Yoo Jin Choi
;In-So Kweon
;In-So Kweon
;Javier Toro  
;Javier Toro --
;Sei-Wang Chen
;Sei-Wang Chen --
;Ron O. Dror
;Ron O. Dror
;Edward H. Adelson
;Edward H. Adelson
Línea 77: Línea 70:
;Katsushi Ikeuchi
;Katsushi Ikeuchi
;Robby T. Tan
;Robby T. Tan
;Yoichi sato
;Ko Nishino
;Ko Nishino
;Imari Sato
;Imari Sato
Línea 90: Línea 82:
;Jun’ichiro Seyama
;Jun’ichiro Seyama
;J. Lellmann
;J. Lellmann
;J. Balzer
;J. Balzer --
;A. Rieder
;A. Rieder
;J. Beyerer
;J. Beyerer --
;Rogerio Feris
;Rogerio Feris
;Ramesh Raskar
;Ramesh Raskar
Línea 102: Línea 94:
;Guy Godin
;Guy Godin
;Todd Zickler
;Todd Zickler
;Marc Ebner
;Marc Ebner --
;Harold B. Westlund
;Harold B. Westlund
;Gary W. Meyer
;Gary W. Meyer --


</td><td valign=top>  
</td><td valign=top>  
Línea 122: Línea 114:
:Harvard University, Cambridge, USA
:Harvard University, Cambridge, USA
:National Laboratory of Pattern Recognition, Institute of Automation, Chinese Academy of Sciences, Beijing, China
:National Laboratory of Pattern Recognition, Institute of Automation, Chinese Academy of Sciences, Beijing, China
:Robotics and Computer Vision Lab. Dept. of EECS, KAIST, Korea
:Computer Vision Lab, Department of Information and Communications, GIST, Republic of Korea
:Mobile Multimedia Lab. LG Electronics Institute of Technology
:Robotics and Computer Vision Lab. Dept. of EECS, KAIST, Korea
:Robotics and Computer Vision Lab. Dept. of EECS, KAIST, Korea
:Grupo de Ingeniería Biomédica, Universidad de los Andes, Venezuela
:Grupo de Ingeniería Biomédica, Universidad de los Andes, Venezuela
Línea 132: Línea 123:
:Department of Computer Science The University of Tokyo
:Department of Computer Science The University of Tokyo
:Department of Computer Science The University of Tokyo
:Department of Computer Science The University of Tokyo
:The University of Tokyo
:
:Department of Computer Science Columbia University
:Department of Computer Science Columbia University
:The University of Tokyo
:The University of Tokyo
Línea 145: Línea 136:
:Department of Psychology, Tokyo, Japan
:Department of Psychology, Tokyo, Japan
:Informatik (ITEC), Department of Computer Science, University of Karlsruhe, Germany
:Informatik (ITEC), Department of Computer Science, University of Karlsruhe, Germany
:Informatik (ITEC), Department of Computer Science, University of Karlsruhe, Germany
:Geometric Modeling and Industrial Geometry, Institute of Discrete Mathematics and Geometry, Vienna University of Technology
:Informatik (ITEC), Department of Computer Science, University of Karlsruhe, Germany
:Informatik (ITEC), Department of Computer Science, University of Karlsruhe, Germany
:Department of Mathematics, University of Karlsruhe, Karlsruhe, Germany
:Department of Mathematics, University of Karlsruhe, Karlsruhe, Germany
Línea 172: Línea 163:
===Paper submission===
===Paper submission===


:Submission of papers: 1 March 2009


:Notification of acceptance: 1 April 2009
[http://www.prosemanager1.co.uk/kes2009is/submitpaper.asp Web page to upload your paper]


:Final paper to be received by: 1 May 2009
Select IS05: Intelligent Systems for Reflectance Analysis


===Journal Special Issues ===


''Conference proceedings will be published by Springer-Verlag''


===Author's guidelines===
===Author's guidelines===
[http://kes2009.kesinternational.org/submission.php http://kes2009.kesinternational.org/submission.php]

Revisión actual - 16:19 27 feb 2009

Kes2009.jpg
Ball-1.png
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KES 2009 Special Session on Intelligent Systems for Reflectance Analysis

Chairs

Computational Intelligence Group, UPV/EHU

Contact email

[1]

Rationale for the special session

Reflectance Analysis is a key process in computer vision systems and applications. It allows the robust segmentation of the images. It has been studied and applied in autononomous robotics, multimodal human computer interaction and remote sensing. There are some physical models of the interaction between light and the surfaces that have been used either for image rendering (visualization) or for image analysis. The most general is the BRDF model used in visualization programs. The Dichromatic Reflection Model has been proposed for the reflectance analysis of general images. This model is local and generalizations involving spatial information and non-linear effects will greatly increase its usefulness in real life applications. Knowledge Based Inteligent tools may provide this generalization. Other related paradigms that can benefit from the application of Intelligent Systems tools are Color Constancy and Retinex. The special session is intended to gather researchers applying Reflectance Analysis to real life problems and applications, or proposing innovative computational methods.

Topics of interest

  • Shape from shading
  • Shape from Reflection Analysis
  • Isolating Specular Component
  • Reflectance Maps
  • Reflectance Models
  • Specular and Lambertian Surfaces
  • Geometrics and Photometrics Invariants
  • Methods for Chromatic Illummination Estimation
  • Color Spaces for Reflectance Analysis
  • Mathematical Morphology of Color Spaces and their applicantion in Reflectance Analysis
  • Color Constancy
  • Shadows
  • Computational Intellligence for Reflectance Analysis
  • BTF (bidirectional texture function) and BSSRDF (bidirectional surface scattering reflectance distribution function) and widen your application areas

Important dates

  • Submission of papers: 29 March 2009
  • Notification of acceptance: 25 April 2009
  • Final paper publication files to be received by: 23 May 2009

Program committee (tentative)

Bruce A. Maxwell
Richard M. Friedhoff
Casey A. Smith
H. Ragheb --
R. Hancock
Stephen Grossberg
Z.G. Pan
Jiuai Sun --
J.H. Xin
P. Kakumanu
N. Bourbakis
Hui-Liang Shen
Thomas M. Lehmann --
Todd Zickler
Yihong Wu --
Kuk-Jin Yoon --
In-So Kweon
Javier Toro --
Sei-Wang Chen --
Ron O. Dror
Edward H. Adelson
Alan S. Willsky
Katsushi Ikeuchi
Robby T. Tan
Ko Nishino
Imari Sato
Yana Mileva
Andrés Bruhn
Joachim Weickert
Lavanya Sharan
A. Smolarz
Peter Orbanz
Lin Li
Gus Wiseman
Jun’ichiro Seyama
J. Lellmann
J. Balzer --
A. Rieder
J. Beyerer --
Rogerio Feris
Ramesh Raskar
Karhan Tan
Matthew Turk
Roger Trias-Sanz
Georges Stamon
Jean Louchet
Guy Godin
Todd Zickler
Marc Ebner --
Harold B. Westlund
Gary W. Meyer --
Tandent Vision Science, Inc. USA
Tandent Vision Science, Inc. USA
Tandent Vision Science, Inc. USA
Digital Imaging Research Centre, Kingston University London
Department of Computer Science, University of York
Laboratory of Sensorimotor Research, USA
State Key Lab of CAD&CG, Zhejiang University, China
Machine Vision Lab, Faculty of CEMS, University of the West of England, UK
The Hong Kong Polytechnic University, Hong Kong, China
ITRI/Department of Computer Science and Engineering, Wright State University, USA
ITRI/Department of Computer Science and Engineering, Wright State University, USA
Department of Information and Electronic Engineering, Zhejiang University, China
Institute of Medical Informatics, Aachen University of Technology, Germany
Harvard University, Cambridge, USA
National Laboratory of Pattern Recognition, Institute of Automation, Chinese Academy of Sciences, Beijing, China
Computer Vision Lab, Department of Information and Communications, GIST, Republic of Korea
Robotics and Computer Vision Lab. Dept. of EECS, KAIST, Korea
Grupo de Ingeniería Biomédica, Universidad de los Andes, Venezuela
Department of Computer Science and Information Engineering National Taiwan Normal University, Taiwan
Department of Electrical Engineering and Computer Science, MIT
Department of Brain and Cognitive Sciences, MIT
Department of Electrical Engineering and Computer Science, MIT
Department of Computer Science The University of Tokyo
Department of Computer Science The University of Tokyo
Department of Computer Science Columbia University
The University of Tokyo
Mathematical Image Analysis Group, Saarland University, Germany
Mathematical Image Analysis Group, Saarland University, Germany
Mathematical Image Analysis Group, Saarland University, Germany
Department of Electrical Engineering and Computer Science, MIT
University of Technology of Troyes, ICD Laboratory FRE CNRS, FRANCE
Institute of Computational Science, ETH Zürich
Department of Earth Sciences, Indiana University – Purdue University, USA
Department of Mathematics, University of California
Department of Psychology, Tokyo, Japan
Informatik (ITEC), Department of Computer Science, University of Karlsruhe, Germany
Geometric Modeling and Industrial Geometry, Institute of Discrete Mathematics and Geometry, Vienna University of Technology
Informatik (ITEC), Department of Computer Science, University of Karlsruhe, Germany
Department of Mathematics, University of Karlsruhe, Karlsruhe, Germany
UCSB–University of California, Santa Barbara, USA
MERL–Mitsubishi Electric Research Labs, Cambridge, USA
MERL–Mitsubishi Electric Research Labs, Cambridge, USA
UCSB–University of California, Santa Barbara, USA
Institut Géographique National, France
Université de Paris, France
Equipe COMPLEX, INRIA, France
Equipe COMPLEX, INRIA, France
Harvard University, USA
Universität Würzburg, Germany
Departament of computer and Information Science, Canada
Departament of computer and Information Science, U.S.A




Paper submission

Web page to upload your paper

Select IS05: Intelligent Systems for Reflectance Analysis


Conference proceedings will be published by Springer-Verlag

Author's guidelines

http://kes2009.kesinternational.org/submission.php