KES2009 Reflectance Analysis

Special Session on Reflectance Analysis

• KES 2009

Chairs

• Ramón Moreno
• Manuel Graña

Computational Intelligence Group, UPV/EHU

Contact email

[1]

Description

El anlálisis de Reflectancia es un proceso fundamental en todos sistema de visión por computador. El conocimineto de las propiedades ópticas de los materiales y el comportamiento de la luz sobre estos, es lo que nos permite asociar la información contenida en la imagen con la realidad observada. Varios modelos de reflectancia han sido propuestos ( Dichromatic reflection model, BRDF y sus derivados) su aplicación es fundamental tanto para visión como para visualización. Son muchos los paradigmas concernientes; Color constancy, espacios de color, estudio de la luz, propiedades de los materiales, optics, photometry, radiometry,...

El gran objetivo de esta Special Session es tener un punto de encuentro para investigadores en este area, algo inusual en otros congresos.

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Reflectance Analysis is a key process for computer vision systems. The knowledge of optical and phisycs properties of materials under light efects, let us to find the relacionship between image information and observed reality. Some models had been proposed for reflectance (Dichromatic Reflection Model, BRDF and their derivatives) their application is key for vision process and for visualization process too. A lot of paradigms are related to reflectance analysis; color constancy, color spaces, light research, phisycs properties of materials, optics, photometry, radiometry, ...

The goal of this Special Session is to serve a meeting point for researches in this area.

Topics of interest

Shape from shading

Shape from Reflection Analysis

Sepaparating Specular Component

Reflectance Maps

Reflectance Models

Specular and Lambertian Surfaces

Geometrics and Photometrics Invariants

Methods for Chromatic Illummination Estimation

Color Spaces for Reflectance Analysis

Mathematical Morphology of Color Spaces and their applicantion in Reflectance Analysis

Color Constancy

Shadows

Program committee

Bruce A. Maxwell Richard M. Friedhoff Casey A. Smith H. Ragheb R. Hancock Stephen Grossberg Z.G. Pan Jiuai Sun J.H. Xin P. Kakumanu N. Bourbakis Hui-Liang Shen Thomas M. Lehmann Todd Zickler Yihong Wu Jiuai Sun Kuk-Jin Yoon Yoo Jin Choi In-So Kweon Javier Toro Sei-Wang Chen Ron O. Dror Edward H. Adelson Alan S. Willsky Ping Tan

Tandent Vision Science, Inc. USA Tandent Vision Science, Inc. USA Tandent Vision Science, Inc. USA Digital Imaging Research Centre, Kingston University London Department of Computer Science, University of York Laboratory of Sensorimotor Research, USA State Key Lab of CAD&CG, Zhejiang University, China Machine Vision Lab, Faculty of CEMS, University of the West of England, UK The Hong Kong Polytechnic University, Hong Kong, China ITRI/Department of Computer Science and Engineering, Wright State University, USA ITRI/Department of Computer Science and Engineering, Wright State University, USA Department of Information and Electronic Engineering, Zhejiang University, China Institute of Medical Informatics, Aachen University of Technology, Germany Harvard University, Cambridge, USA National Laboratory of Pattern Recognition, Institute of Automation, Chinese Academy of Sciences, Beijing, China Robotics and Computer Vision Lab. Dept. of EECS, KAIST, Korea Mobile Multimedia Lab. LG Electronics Institute of Technology Robotics and Computer Vision Lab. Dept. of EECS, KAIST, Korea Grupo de Ingeniería Biomédica, Universidad de los Andes, Venezuela Department of Computer Science and Information Engineering National Taiwan Normal University, Taiwan Department of Electrical Engineering and Computer Science, MIT Department of Brain and Cognitive Sciences, MIT Department of Electrical Engineering and Computer Science, MIT

Katsushi Ikeuchi Robby T. Tan Stephen Lin Long Quan Yoichi sato Ko Nishino Imari Sato Yana Mileva Andrés Bruhn Joachim Weickert Lavanya Sharan B. Jacquin A. Smolarz Peter Orbanz Joachim M. Buhmann Melvyn Smith Lyndon Smith Sagar Midha Jeff Bamber Lin Li Gus Wiseman Jun’ichiro Seyama Takao Sato J. Lellmann J. Balzer A. Rieder J. Beyerer Rogerio Feris Ramesh Raskar Karhan Tan Matthew Turk Roger Trias-Sanz Georges Stamon Jean Louchet Shinji Umeyama Guy Godin Todd Zickler Satya P. Mallick David J. Kriegman Peter N. Belhumeur Marc Ebner Harold B. Westlund Gary W. Meyer