Diferencia entre revisiones de «KES2009 Reflectance Analysis»

De Grupo de Inteligencia Computacional (GIC)
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Reflecatnce Analysis is a key process for computer vision systems. The knowledge of optical and phisycs properties of materials under light efects, let us to find the relacionship between image information and observed reality. Some models had been proposed reflectance (Dichromatic Reflection Model, BRDF and their derivatives) their application is key for vision process and for visualization process too. A lot of paradigms are related to reflectance analysis; color constancy, color spaces, light research, phisycs properties of materials, optics, photometry, radiometry, ...
Reflectance Analysis is a key process for computer vision systems. The knowledge of optical and phisycs properties of materials under light efects, let us to find the relacionship between image information and observed reality. Some models had been proposed reflectance (Dichromatic Reflection Model, BRDF and their derivatives) their application is key for vision process and for visualization process too. A lot of paradigms are related to reflectance analysis; color constancy, color spaces, light research, phisycs properties of materials, optics, photometry, radiometry, ...
: The goal of this Special Session is to serve a meeting point for researches in this area.
: The goal of this Special Session is to serve a meeting point for researches in this area.



Revisión del 08:35 15 oct 2008

Special Session on Reflectance Analysis
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Chairs

  • Ramón Moreno
  • Manuel Graña

Computational Intelligence Group, UPV/EHU

Contact email

[1]

Description

El anlálisis de Reflectancia es un proceso fundamental en todos sistema de visión por computador. El conocimineto de las propiedades ópticas de los materiales y el comportamiento de la luz sobre estos, es lo que nos permite asociar la información contenida en la imagen con la realidad observada. Varios modelos de reflectancia han sido propuestos ( Dichromatic reflection model, BRDF y sus derivados) su aplicación es fundamental tanto para visión como para visualización. Son muchos los paradigmas concernientes; Color constancy, espacios de color, estudio de la luz, propiedades de los materiales, optics, photometry, radiometry,...

El gran objetivo de esta Special Session es tener un punto de encuentro para investigadores en este area, algo inusual en otros congresos.

Reflectance Analysis is a key process for computer vision systems. The knowledge of optical and phisycs properties of materials under light efects, let us to find the relacionship between image information and observed reality. Some models had been proposed reflectance (Dichromatic Reflection Model, BRDF and their derivatives) their application is key for vision process and for visualization process too. A lot of paradigms are related to reflectance analysis; color constancy, color spaces, light research, phisycs properties of materials, optics, photometry, radiometry, ...

The goal of this Special Session is to serve a meeting point for researches in this area.

Important dates

Topics of interest

Shape from shading
Shape from Reflection Analysis
Sepaparating Specular Component
Reflectance Maps
Reflectance Models
Specular and Lambertian Surfaces
Geometrics and Photometrics Invariants
Methods for Chromatic Illummination Estimation
Color Spaces for Reflectance Analysis
Mathematical Morphology of Color Spaces and their applicantion in Reflectance Analysis
Color Constancy
Shadows

Program committee

Bruce A. Maxwell
Richard M. Friedhoff
Casey A. Smith
H. Ragheb
R. Hancock
Brian Funt
Simon Hong
Stephen Grossberg
Z.G. Pan
Jiuai Sun
P. Wang
J.H. Xin
M.M. Zhang
H.L. Shen
P. Kakumanu
S. Makrogiannis
N. Bourbakis
Hui-Liang Shen
Hong-Gang Zhang
Si-Jie Shao
John H. Xin
Thomas M. Lehmann
Christoph Palm
Todd Zickler
Satya P. Mallick
David J. Kriegman
Peter N. Belhumeur
Yihong Wu
Jiuai Sun
Youfu Li
Zhanyi Hu
Kuk-Jin Yoon
Yoo Jin Choi
In-So Kweon
Javier Toro
Yun-Chung Chung
Shyang-Lih Chang
Shen Cherng
Sei-Wang Chen
Ron O. Dror
Edward H. Adelson
Alan S. Willsky
Ping Tan
Stephen Lin
Long Quan
Robby T. Tan
Ko Nishino
Katsushi Ikeuchi
Imari Sato
Yoichi sato
Yana Mileva
Andrés Bruhn
Joachim Weickert
Lavanya Sharan
B. Jacquin
A. Smolarz
Peter Orbanz
Joachim M. Buhmann
Melvyn Smith
Lyndon Smith
Sagar Midha
Jeff Bamber
Lin Li
Gus Wiseman
Jun’ichiro Seyama
Takao Sato
J. Lellmann
J. Balzer
A. Rieder
J. Beyerer
Rogerio Feris
Ramesh Raskar
Karhan Tan
Matthew Turk
Roger Trias-Sanz
Georges Stamon
Jean Louchet
Shinji Umeyama
Guy Godin
Todd Zickler
Satya P. Mallick
David J. Kriegman
Peter N. Belhumeur
Marc Ebner
Harold B. Westlund
Gary W. Meyer



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